INTEGRATED METROLOGY

Welcome to the Brand page for “INTEGRATED METROLOGY”, which is offered here for Thin film and wafer surface measurement and inspection products which are designed to fit inside or be mounted onto production equipment used in the manufacturing of integrated circuits, such as chemical mechanical polishers, chemical vapor deposition systems, and other related equipment;.

Its status is currently believed to be active. Its class is unavailable. “INTEGRATED METROLOGY” is believed to be currently owned by “Nanometrics Incorporated”.


Owner:
NANOMETRICS INCORPORATED
Owner Details
Description:
Thin film and wafer surface measurement and inspection products which are designed to fit inside or be mounted onto production equipment used in the manufacturing of integrated circuits, such as chemical mechanical polishers, chemical vapor deposition systems, and other related equipment;
Categories: THIN FILM WAFER SURFACE