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Welcome to the Brand page for “MICROSCAN”, which is offered here for Computer based station for the automatic characterization of semiconductor wafers as to thickness, global and site flatness, bow, warp, conductivity type, resistivity and other parameters;micro scan;.
Its status is currently believed to be active. Its class is unavailable. “MICROSCAN” is believed to be currently owned by “KLA-TENCOR CORPORATION”.
| Owner: |
KLA-TENCOR CORPORATION
Owner Details |
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| Description: |
COMPUTER BASED STATION FOR THE AUTOMATIC CHARACTERIZATION OF SEMICONDUCTOR WAFERS AS TO THICKNESS, GLOBAL AND SITE FLATNESS, BOW, WARP, CONDUCTIVITY TYPE, RESISTIVITY AND OTHER PARAMETERS;MICRO SCAN;
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| Categories: | COMPUTER BASED STATION FOR |