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Welcome to the Brand page for “MIGHTYSPEC”, which is offered here for A metrology tool for measuring the thickness, and analyzing the composition of certain films such as, but not limited to, polycrystalline films deposited on substrates including, but not limited to, semiconductor wafers, flat panel display substrates and magnetic head substrates, such film properties are determined by various methods such as, but not limited to, reflectometry, ellipsometry and interferometry;mighty spec;.
Its status is currently believed to be active. Its class is unavailable. “MIGHTYSPEC” is believed to be currently owned by “Nanometrics Incorporated”.
| Owner: |
NANOMETRICS INCORPORATED
Owner Details |
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| Description: |
A metrology tool for measuring the thickness, and analyzing the composition of certain films such as, but not limited to, polycrystalline films deposited on substrates including, but not limited to, semiconductor wafers, flat panel display substrates and magnetic head substrates, such film properties are determined by various methods such as, but not limited to, reflectometry, ellipsometry and interferometry;MIGHTY SPEC;
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| Categories: | MIGHTY SPEC |