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Welcome to the Brand page for “NANOOCS”, which is offered here for Overlay optical metrology systems comprised of measurement optics, wafer handling mechanisms and system control hardware and software for measuring the difference between two nearly coincident patterns on a sample, such as a semiconductor wafer, which patterns are formed by a process such as photolithography, and which patterns are overlaid, one on top of the other and the overlay difference or error may be fed back to the exposure system that created the patterns so that this difference may be corrected on future exposures;.
Its status is currently believed to be active. Its class is unavailable. “NANOOCS” is believed to be currently owned by “Nanometrics Incorporated”.
| Owner: |
NANOMETRICS INCORPORATED
Owner Details |
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| Description: |
Overlay optical metrology systems comprised of measurement optics, wafer handling mechanisms and system control hardware and software for measuring the difference between two nearly coincident patterns on a sample, such as a semiconductor wafer, which patterns are formed by a process such as photolithography, and which patterns are overlaid, one on top of the other and the overlay difference or error may be fed back to the exposure system that created the patterns so that this difference may be corrected on future exposures;
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| Categories: | OVERLAY OPTICAL METROLOGY SYSTEMS COMPRISED |