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Welcome to the Brand page for “NANOUDI”, which is offered here for Metrology system for the detection and measurement of particles and defects comprised principally of low distortion optics, a high intensity broadband light source, high resolution detector, and image processing and defect detection software, that enables inspection of both the front and backside of a sample, particularly, a semiconductor wafer, mask, flat panel display, or magnetic substrate;.
Its status is currently believed to be active. Its class is unavailable. “NANOUDI” is believed to be currently owned by “Nanometrics Incorporated”.
| Owner: |
NANOMETRICS INCORPORATED
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| Description: |
Metrology system for the detection and measurement of particles and defects comprised principally of low distortion optics, a high intensity broadband light source, high resolution detector, and image processing and defect detection software, that enables inspection of both the front and backside of a sample, particularly, a semiconductor wafer, mask, flat panel display, or magnetic substrate;
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| Categories: | METROLOGY SYSTEM DETECTION |