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Brands and Their Owners
| Core Wafer Systems, Inc. contact information is shown below | |
| Owner: | CORE WAFER SYSTEMS, INC. |
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| Owner Address: | 212 15TH AVE NE WASECA MN 56093 |
| Owner Web Site | |
| Owner Phone | |
| Owner Toll Free | |
| Owner Fax |
| Brand: |
ASUR |
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| Description: | Computer software for use in providing single site and multi die parallel parametric measurements, and reliability and analysis assessments for the semiconductor and nano technology industries; |
| Category: | COMPUTER SOFTWARE USE |
| Brand: |
PDQ |
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| Description: | computer software used for measuring solid-state physics phenomena to determine device reliability and parametrics in the fields of semiconductor manufacturing and nanotechnology; |
| Category: | COMPUTER SOFTWARE USED MEASURING |
| Brand: |
PDQ-WLR |
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| Description: | computer software used for measuring solid-state physics phenomena to determine device reliability and parametrics in the fields of semiconductor manufacturing and nanotechnology; |
| Category: | COMPUTER SOFTWARE USED MEASURING |
| Brand: |
TESLA LOGOS |
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| Description: | MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES; |
| Category: | MEASUREMENT METHODOLOGY TECHNIQUES SOFTWARE |
| Brand: |
TESLA NEWTON |
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| Description: | MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES; |
| Category: | MEASUREMENT METHODOLOGY TECHNIQUES SOFTWARE |
| Brand: |
TESLA PDR |
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| Description: | MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES; |
| Category: | MEASUREMENT METHODOLOGY TECHNIQUES SOFTWARE |
| Brand: |
TESLA PPR |
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| Description: | MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES;TESLA PARALLEL PARAMETRIC RELIABILITY; |
| Category: | MEASUREMENT METHODOLOGY TECHNIQUES SOFTWARE |
| Brand: |
TESLA SDR |
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| Description: | MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES; |
| Category: | MEASUREMENT METHODOLOGY TECHNIQUES SOFTWARE |
| Brand: |
TESLA SPR |
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| Description: | MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES; |
| Category: | MEASUREMENT METHODOLOGY TECHNIQUES SOFTWARE |
| Brand: |
TESLA SUITE |
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| Description: | MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES; |
| Category: | MEASUREMENT METHODOLOGY TECHNIQUES SOFTWARE |
| Brand: |
TESLA VRA |
|---|---|
| Description: | MEASUREMENT METHODOLOGY AND TECHNIQUES SOFTWARE AND INTELLECTUAL PROPERTY CONSISTING OF: SINGLE SITE AND MULTI DIE PARALLEL PARAMETRIC, RELIABILITY AND ANALYSIS SOFTWARE FOR SEMICONDUCTOR, NANO TECHNOLOGY AND DERIVITIVES; |
| Category: | MEASUREMENT METHODOLOGY TECHNIQUES SOFTWARE |