FEI COMPANY

AQUILOS

Electron microscope;

ARCTIS

cryo dual-beam electron microscope;ARC T IS;

CLEANMILL

Laboratory instrument, namely, an ion beam polisher;CLEAN MILL;

COLORSEM

Software for scanning electron microscopes to color images based on elemental data;COLOR SEM;

ESEM

electron microscopes;

EXSOLVE

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources;

FEI

high brightness, submicron focused ion and electron beam systems using field emission technology; namely, for ion beam micromachining, ion milling, ion lithography, ion microscopes, secondary ion mass spectroscopy, electron microscopes and combined ion beam milling/electron microscope systems; high brightness, submicron ion and electron beam columns using field emission technology; namely, ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, electron beam lithography, and electron beam microscopy; single crystal source materials; namely, refractory metals, LaB6 Mini-Vogel Mount cathodes, cold field emitters, Schottky emitters, and liquid metal ion sources;fei;

FEI

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, focused electron beam columns for electron beam lithography, and electron beam microscopy; single crystal source materials, namely, refractory metals, LaB6 mini-vogel cathodes, CeB6 mini-vogel mount cathodes, control grid electrodes, namely, rebuilt wehnelts; cold field emitters, schottky emitters, and liquid metal ion sources;COMPONENTS;

FEI BEAM TECHNOLOGY

HIGH BRIGHTNESS, SUBMICRON ION AND ELECTRON BEAM COLUMNS USING FIELD EMISSION TECHNOLOGY; NAMELY, FOCUSED ION BEAM COLUMNS FOR ION LITHOGRAPHY, ION BEAM MILLING, SECONDARY ION MASS SPECTROSCOPY, FOCUSED ELECTRON BEAM COLUMNS FOR ELECTRON BEAM LITHOGRAPHY, AND ELECTRON BEAM MICROSCOPY; SINGLE CRYSTAL SOURCE MATERIALS; NAMELY, REFRACTORY METALS, LaB6 MINI-VOGEL MOUNT CATHODES, CeB6 MINI-VOGEL MOUNT CATHODES, WEHNELT REBUILDING SERVICE, COLD FIELD EMITTERS, SCHOTTKY EMITTERS, AND LIQUID METAL ION SOURCES;BEAM TECHNOLOGY;

GLACIOS

Electron microscope;

HELIOS HYDRA

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources;

IFLM

Laboratory apparatus, namely, an optical instrument for imaging inside an electron microscope;FILM;

INFAB LAB

Laboratory unit comprising one or more pieces of laboratory equipment, computer hardware, computer software and instruction manuals all sold as a unit for installation and use within an integrated circuit fabrication facility for sampling, testing, measuring, and altering integrated circuits and their manufacturing processes, and for reporting, transmitting in electronic form, and organizing information produced by the laboratory unit; and parts therefor;LAB;

KRIOS

Electron microscope;

MEGALAB

software for controlling semiconductor test inspection and/or manufacturing equipment;MEGA LABORATORY;

MEGALAB

software for use in semiconductor manufacturing;In the statement, Column 1, before line 1, ELECTROGLAS, INC. (DELAWARE CORPORATION) 6024 SILVER CREEK VALLEY ROAD SAN JOSE, CA 95138, by merger should be inserted.;MEGA LAB;The lining shown in the drawing of the mark is a feature of the mark and is not intended to indicate color.;

NANOPORT

Providing facilities for educational training in the field of electron microscopes;NANO PORT;Providing demonstration of products in the field of electron microscopes;

OPTIS

Scanning transmission electron microscope for sample preparation and imaging analysis in the field of semiconductors;

SCIOS

high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources;

SEEING THINGS YOU'VE NEVER SEEN BEFORE

maintenance and repair services of electron microscopes;SEEING THINGS YOU HAVE NEVER SEEN BEFORE;

SEEING THINGS YOU'VE NEVER SEEN BEFORE

electron microscopes for environmental use;SEEING THINGS YOU HAVE SEEN BEFORE;

TALOS ARCTICA

Electron microscope;TALOS ARCTIC A;

TALOS ARTICA

Electron microscope;

THE NEW OREGON TRAIL

Business consulting services, namely, advising businesses on business opportunities and investment opportunities for businesses;

TOMOGRID

Laboratory apparatus, namely, a carrier for samples in the field of electron microscopy;

VITROBOT

Laboratory instrument for processing samples for single particle analysis and/or cryo-tomography research applications;VITRO BOT;

VOLUMESCOPE

Electron microscope;VOLUME SCOPE;

YIELDMANAGER

computer software programs for use in manufacturing of products;YIELD MANAGER;