JENTEK Sensors, Inc.

GRIDSTATION

data acquisition and analysis computer programs and software used with electromagnetic and dielectrometer sensors and probes, computer hardware and measurement systems used for process control, quality control and field inservice inspection, and for the measurement of residual stress, of geometric properties, such as layer or coating thickness, and of electrical properties, such as conductivity and permeability, and for monitoring of age-related degradation;GRID STATION;

GRIDSTATION

data acquisition and analysis software and hardware for use with multivariant measurement and analysis sensor systems used for measuring electrical properties, such as conductivity and permeability, of materials such as metals, composites and ceramics, and geometric properties, such as layer and coating thickness, of multilayered and coated manufactured goods such as aircraft skins, turbine blades, flat panel displays, semiconductors, and used for process and quality control of the manufacture of adhesives and metallic, graphite composite, ceramic, glass, paper, epoxy, and plastic parts, field inspection, including measurement of residual stress and monitoring age-related degradation, of structures, equipment and machinery such as bridges, aircraft components, turbine blades, automobile parts, nuclear and fossile fuel power plants, propellers, aircraft engine components and railway car components and rails, for object detection and discrimination such as detection of buried objects such as landmines, unexploded ordnance, archeological artifacts and environmental hazards, and for relating electrical properties of materials and manufactured goods, such as those mentioned above, to mechanical or other process properties, such as cure states, stress, temperature, fatigue life, corrosion state, heat treatment quality, wear, moisture content, porosity, contamination and residual protective capacity for filter materials;GRID STATION;

GRIDSTATION

Electronic systems comprising data acquisition and analysis computer programs and software, electromagnetic and dielectrometer sensors and probes, and computer hardware and measurement systems, namely, impedance instrumentation, eddy current testing equipment, dynamic stress and/or temperature measurement equipment, calibration equipment, and materials testing equipment; all of the foregoing used for process control, quality control and field inservice inspection, and for the measurement of residual stress, of geometric properties, such as layer or coating thickness, and of electrical properties, such as conductivity and permeability, and for monitoring of age-related degeneration;GRID STATION;

HYPERLATTICE

Electronic database, recorded on computer-readable media, in the field of non-destructive testing for use in estimating unknown quantities;HYPER LATTICE;

IDED

Dielectrometer sensors, probes and sensor arrays, designed for measuring electrical properties, such as conductivity and permittivity, of materials, such as insulators and semiconductors, and geometric properties, such as layer and coating thickness, of multilayered and coated manufactured goods, such as adhesive tapes, display materials, paints and laminates, and used for process and quality control of the manufacture of epoxy, polymer, cellulose, cement, ceramic, and fiberglass composite parts, such as turbine blade coatings, battery separators, pressboard insulation, and wind turbine blades; for field inspections and degradation monitoring of cement or polymer-based structures such as bridges, roads and pipes; for object detection and discrimination such as detection of buried objects such as plastic and metallic landmines, reinforcement bars in concrete, buried pipes, unexploded ordnance, archaeological artifacts and environmental hazards; and for relating electrical properties of materials and manufactured goods, such as those mentioned above, to mechanical or other process properties, such as state of cure, porosity, water content, toxic chemical absorption, flaw size, and interfacial electrochemical parameters;

JENTEK

electromagnetic and dielectrometer sensors and probes, computer hardware, data acquisition and analysis software and measurement systems used for process control, quality control and field inservice inspection, and for the measurement of residual stress, of geometric properties, such as layer or coating thickness, and of electrical properties, such as conductivity and permeability, and for monitoring of age-related degradation;

JENTEK

measurement and analysis systems comprising electromagnetic inductive and capacitive and dielectrometer sensors, probes and sensor arrays, computer hardware, impedance analyzers, and data acquisition and analysis software, designed for measuring electrical properties, such as conductivity and permeability, of materials such as metal, composites and ceramics, and geometric properties, such as layer and coating thickness, of multilayered and coated manufactured goods such as aircraft skins, turbine blades, flat panel displays, semiconductors, and used for process and quality control of the manufacture of adhesives and metallic, graphite composite, ceramic, glass, paper, epoxy, and plastic parts, field inspection, namely, measurement of residual stress and monitoring age-related degradation, of structures, equipment and machinery such as bridges, aircraft components, turbine blades, automobile parts, nuclear and fossile fuel power plants, propellers, aircraft engine components and railway car components and rails, for object detection and discrimination such as detection of buried objects such as landmines, unexploded ordnance, archeological artifacts and environmental hazards, and for relating electrical properties of materials and manufactured goods, such as those mentioned above, to mechanical or other process properties, such as cure states, stress, temperature, fatigue life, corrosion state, heat treatment quality, wear, moisture content, porosity, contamination and residual protective capacity for filter materials;

JENTEK SENSORS

electromagnetic and dielectrometer sensors and probes, computer hardware, data acquisition and analysis software and measurement systems used for process control, quality control and field inservice inspection, and for the measurement of residual stress, of geometric properties, such as layer or coating thickness, and of electrical properties, such as conductivity and permeability, and for monitoring of age-related degradation;SENSORS;

JET

Electrical eddy current test equipment;

JETI

Electrical eddy current test equipment; Handheld computers;JET I;

MWM

electromagnetic and dielectrometer sensors and probes, computer hardware, data acquisition and analysis software and measurement systems used for process control, quality control and field inservice inspection, and for the measurement of residual stress, of geometric properties, such as layer or coating thickness, and of electrical properties, such as conductivity and permeability, and for monitoring of age-related degradation;

MWM

magnetometer sensors, probes and sensor arrays, designed for measuring electrical properties, such as conductivity and permeability, of materials such as metals and graphite composites, and geometric properties, such as layer and coating thickness, of multilayered and coated manufactured goods such as aircraft skins, turbine blades, flat panel displays, semiconductors, and used for process and quality control of the manufacture of metallic and graphite composite parts field inspection, namely, measurement of residual stress and monitoring age-related degradation, of structures, equipment and machinery such as bridges, aircraft components, turbine blades, automobile parts, nuclear and fossile fuel power plants, propellers, aircraft engine components and railway car components and rails, for object detection and discrimination such as detection of buried objects such as landmines, unexploded ordnance, archeological artifacts and environmental hazards, and for relating electrical properties of materials and manufactured goods, such as those mentioned above, to mechanical or other process properties, such as stress, temperature, fatigue life, corrosion state, heat treatment quality, wear, porosity, and contamination;

PIG-IT

Pipe Inspection systems, primarily comprising, an inspection gauge for traveling through a pipe, electronic sensor arrays and probes mounted on the gauge, with computer programs and software for data acquisition and analysis, and computer hardware and measurement equipment, namely, electro-magnetic field based inline inspection tools, for providing the data;

SENSORTAPE

electromagnetic and other thin conformable sensors used for process control, quality control and field inservice inspection and measurement of certain operating, performance and other parameters, such as residual stress, layer or coating thickness, conductivity and permeability and for monitoring of age-related degradation;SENSOR TAPE;