MALVERN PANALYTICAL B.V.

1DER

Scientific, measuring and detecting apparatus and instruments, namely, diffractometers, X-ray diffractometers and wafer analysers; X-ray detecting apparatus and instruments not for medical purposes; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; X-ray detectors not for medical use; analytical apparatus for analysing samples in scientific, industrial and laboratory applications, namely, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and wafer analysers; materials characterization apparatus, in the nature of scientific and measuring apparatus and instruments, namely, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, namely diffractometers, X-ray diffractometers and X-ray diffraction meters; metrology tools, namely diffractometers, X-ray diffractometers and X-ray diffraction meters; diffraction apparatus for microscopy; diffraction apparatus and instruments; X-ray diffraction instruments; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for determining X-ray intensities, not for medical purposes; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with X-ray apparatus, not for medical purposes; component parts and fittings for all the aforesaid goods;ONE DER;

AMASS

Computer software for use in analyzing thin films and thin layers; computer software for use in displaying, simulating, and fitting X-ray scattering data from single crystal substrates and heteroepitaxial layers; computer software for use in characterizing thin films and thin layers;Design, development, implementation and programming of computer software for use in analyzing thin films and thin layers; design, development, implementation and programming of computer software for use in displaying, simulating, and fitting X-ray scattering data from single crystal substrates and heteroepitaxial layers; design, development, implementation, and programming of computer software for use in characterizing thin films and thin layers; installation and repair services relating to computer software for use in analyzing thin films and thin layers; installation and repair services relating to computer software for use in displaying, simulating, and fitting X-ray scattering data from single crystal substrates and heteroepitaxial layers; installation and repair services relating to computer software for use in characterizing thin films and thin layers;

AXIOS

X-RAY ANALYSIS APPARATUS, NOT FOR MEDICAL USE;

CHI-BLUE

Anti-corrosive coatings for use with x-ray tubes;

CUBIX

X-ray analysis apparatus, not for medical purposes;in the statement, column 1, before line 1, Koninklijke Philips Electronics N.V. (Netherlands Limited Liability Company), Groenewoudseweg 1, Eindhover, Netherlands, by change of name should be inserted.;

CUBIX3

The mark consists of the word CubiX followed by 3 in superscript.;X-ray analytical apparatus for non-medical purposes; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers for non-medical purposes; wafer analysers; X-ray tubes for non-medical purposes; X-ray apparatus for non-medical purposes; computer software and hardware for use with X-ray diffraction and X-ray diffraction apparatus; parts and fittings for all the aforesaid;CUBIX SQUARED;Color is not claimed as a feature of the mark.;