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Brands and Their Owners
| PARK SYSTEMS CORP. contact information is shown below | |
| Owner: | PARK SYSTEMS CORP. |
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| Owner Address: | 4F, Korea Advanced Nano Fab Center, 109, Gwanggyo-ro, Yeongtonggu, Suwon-si Gyeonggi-do 16229 Republic of Korea |
| Owner Web Site | |
| Owner Phone | |
| Owner Toll Free | |
| Owner Fax |
| Brand: |
EXCELLENCE IN NANOMETROLOGY |
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| Description: | instruments for carrying out microscale and nanoscale measurements and analyses, namely, scanning probe microscopes and atomic force microscopes; |
| Category: | INSTRUMENTS CARRYING OUT MICROSCALE |
| Brand: |
PARK NANOSTANDARD |
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| Description: | Scanning probe microscopes for semiconductor processing; scanning probe microscopes; magnetic measuring apparatus and instruments; electron microscopes; precision measuring apparatus; surface roughness testing machines and instruments; microscopes;PARK NANO STANDARD; |
| Category: | SCANNING PROBE MICROSCOPES SEMICONDUCTOR |
| Brand: |
PARK SMARTANALYSIS |
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| Description: | Scanning probe microscopes for semiconductor processing; scanning probe microscopes; magnetic measuring apparatus and instruments; electron microscopes; precision measuring apparatus; surface roughness testing machines and instruments; microscopes;PARK SMART ANALYSIS; |
| Category: | SCANNING PROBE MICROSCOPES SEMICONDUCTOR |
| Brand: |
PARK SYSTEMS |
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| Description: | Dark blue appears in the text of the wording PARK, while light blue is used as the background of the lower portion of the drawing, on which appears the word SYSTEM. The color white appears in the text of the word SYSTEM, and as the shading in the background behind the word PARK.;Biological microscopes; Metallurgical microscopes; Microscopes; Microscopes and parts thereof; Precision instruments for manipulation and positioning of microscopic objects;The color(s) blue and white is/are claimed as a feature of the mark.;SYSTEMS; |
| Category: | DARK BLUE APPEARS |
| Brand: |
PARK SYSTEMS |
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| Description: | instruments for carrying out microscale and nanoscale measurements and analyses, namely, scanning probe microscopes and atomic force microscopes;SYSTEMS; |
| Category: | INSTRUMENTS CARRYING OUT MICROSCALE |
| Brand: |
XE-3D |
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| Description: | An optical metrology inspection system comprised of a light source, one or more cameras and sensors in communication with computer software and hardware; Biological microscopes; Metallurgical microscopes; Microscopes; Precision instruments for manipulation and positioning of microscopic objects; |
| Category: | OPTICAL METROLOGY INSPECTION SYSTEM |
| Brand: |
XE-3DM |
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| Description: | metrology instruments, namely, scanning probe microscopes and atomic force microscopes;XE-THREE DM; |
| Category: | METROLOGY INSTRUMENTS |