PDF SOLUTIONS, INC.

CHARACTERIZATION VEHICLE

SEMICONDUCTOR TEST CHIPS;In the statement, column 1, line 1, California should be deleted and, Delaware should be inserted.;

CHARACTERIZATION VEHICLE

Consulting, engineering, design and testing services for the manufacture of semiconductors and for yield and performance improvement in the manufacture of semiconductors, all of the foregoing performed for others; design of semiconductor test chips for others;In the statement, Column 1, line 1, California should be deleted, and, Delaware should be inserted.;

CIMETRIX

FACTORY AUTOMATION SOFTWARE, NAMELY, SOFTWARE THAT COMMUNICATES WITH AND CONTROLS THE MOTION AND INPUT/OUTPUT (I/O) OF AUTOMATED MANUFACTURING EQUIPMENT;SOFTWARE SERVICES, NAMELY INTEGRATION OF FACTORY AUTOMATION SOFTWARE IN MANUFACTURING ENVIRONMENTS;

CIMETRIX EQUIPMENTTEST

Computer software for testing communication interfaces on factory production equipment for compliance with industry standards and for suitability for specific factory processing scenarios;CIMETRIX EQUIPMENT TEST;

CIMETRIX HOSTCONNECT

Factory automation software, namely, software that enables communication between factory control systems and manufacturing equipment;CIMETRIX HOST CONNECT;

CIMETRIX INSIGHT

Computer software that monitors, controls, stores, and displays factory manufacturing data;

CIMETRIX SAPIENCE

Computer software that monitors, controls, stores, and displays factory manufacturing data;

CIRCUIT SURFER

COMPUTER SOFTWARE FOR IMPROVING YIELDS AND INCREASING EFFICIENCY IN THE MANUFACTURE OF SEMICONDUCTORS AND MANUALS SOLD AS A UNIT;CIRCUIT;

CV

SEMICONDUCTOR TEST CHIPS;In the statement, Column 1, lines 1-4, are deleted, and PDF SOLUTIONS, INC. (DELAWARE CORPORATION) 333 W. SAN CARLOS, STE 700 SAN JOSE, CA 95110 should be inserted.;

CV

Custom manufacture for others of semiconductor test chips used in tests to improve yield and performance of semiconductors, and consulting services related thereto;In the statement, Column 1, line 1, California should be deleted, and, Delaware should be inserted.;Engineering, design and testing services for others of semiconductors, and consulting services related thereto; design of semiconductor test chips for others;

DATACONDUCTOR

computer software for analyzing and presenting data in connection with the design and development of integrated circuits;DATA CONDUCTOR;

DATAPOWER

Computer software for improving yields amid performance and increasing efficiency, for use in the field of manufacturing, and instruction manuals sold as a unit;DATA POWER;Color is not claimed as a feature of the mark.;[ Engineering and consulting services in the fields of technical support for semiconductor companies and yield and performance improvement in the manufacture of semiconductors ];

DATAPOWER

Computer software for improving yields and performance and increasing efficiency, for use in the field of manufacturing, and instruction manuals sold as a unit in International;DATA POWER;engineering and consulting services in the fields of technical support for semiconductor companies and yield and performance improvement in the manufacture of semiconductors;

DIRECTPROBE

Computer software and hardware providing automated characterization and analysis of test chip and structures and cell library layouts in the field of semiconductor manufacturing;DIRECT PROBE;

DIRECTSCAN

Computer software and hardware for use in providing automated characterization and analysis of product chip and cell library layouts in the field of semiconductor manufacturing;DIRECT SCAN;

EPROBE

The mark consists of magenta background with the word eProbe in white above a white line that fades from right to left.;Semiconductor capital equipment, namely, an electron beam inspection and metrology tool;The color(s) white and magenta is/are claimed as a feature of the mark.;