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Welcome to the Brand page for “ZBEAM”, which is offered here for Metrology apparatus for inspection of semiconductor wafers, substrates and lithographic masks including analysis of substrate and surface topology and defects;z beam;.
Its status is currently believed to be active. Its class is unavailable. “ZBEAM” is believed to be currently owned by “Nanometrics Incorporated”.
| Owner: |
NANOMETRICS INCORPORATED
Owner Details |
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| Description: |
Metrology apparatus for inspection of semiconductor wafers, substrates and lithographic masks including analysis of substrate and surface topology and defects;Z BEAM;
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| Categories: | METROLOGY APPARATUS INSPECTION |