APPARATUS SOFTWARE INSPECTING

Brand Owner (click to sort) Address Description
NANOMAP KLA-Tencor Corporation, 160 Rio Robles San Jose CA 95134 apparatus and software for inspecting semiconductors, semiconductor wafers, and related components;NANO MAP;
NANOTOPOGRAPHY KLA-TENCOR CORPORATION One Technology Drive Milpitas CA 95035 apparatus and software for inspecting semiconductors, semiconductor wafers and parts therefor;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A surface inspecting apparatus for inspecting a shape of a surface of an object to be inspected is disclosed. The surface inspecting apparatus includes a mounting base for mounting the object, a positioning device for positioning the object to an inspecting position on the mounting base, a memory for storing position specifying information for specifying a two-dimensional position of the object when the object is positioned, an inputting device for inputting an outer shape data of the object, and edge position determining device for acquiring an edge position of the object based on the stored position specifying information and the inputted outer shape data.