KLA-TENCOR CORPORATION

3DWAVE

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools;3D WAVE; THREE DIMENSION WAVE;

ABSOLUTE ELLIPSOMETER

OPTICAL INSPECTION EQUIPMENT COMPRISED OF AT LEAST ONE LIGHT SOURCE ARRANGED TO INTERACT WITH A SEMICONDUCTOR WAFER IN ORDER TO DETERMINE THE CHARACTERISTICS THEREOF;ELLIPSOMETER;

ACE

instruments, namely, automated semiconductor wafer test equipment, for testing and inspecting physical and electrical properties of semiconductors, computer hardware and software used for testing and inspecting physical and electrical properties of semiconductors, computer hardware and software for yield management in semiconductor manufacturing and testing;

AFS

Evaluation machines and associated operating software for semiconductor-based products;

ALREADY THERE.

provision of consulting services in connection with testing and analysis for the improvement of yield in semiconductor manufacturing;

API

Computer hardware, software and user manuals sold as a unit, and equipment, namely, inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing;

ARCHER ANALYZER

Computer hardware, software and user manuals sold as a unit and equipment consisting of inspection, metrology and testing hardware, all for inspection, metrology and testing of materials and surfaces;ANALYZER;

ASI

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools;

AWIS

Evaluation machines and associated operating software for semiconductor-based products, all for evaluating surface characteristics, conditions and defects;

BITPOWER

computer software for yield management in semiconductor manufacturing and testing;BIT POWER;

BRI

Computer hardware, namely, computerized illumination regulators for magnifying light for use in the testing and inspection of the physical, material and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools;

CIRCL-AP

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools, namely, electronic apparatus for semiconductor wafer shape metrology and wafer defect inspection;CIRCLE-APPLICATION;

CIRCL-EDGE

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools; cluster tools, namely, electronic apparatus for semiconductor wafer shape metrology and wafer defect inspection;CIRCLE-EDGE;

CIRCL-FOCUS

Computer hardware; computer hardware, namely, computer equipment for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries, for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics, and computer equipment for providing analytic data on the performance of inspection and metrology tools; cluster tools, namely, electronic apparatus for semiconductor wafer shape metrology and wafer defect inspection;CIRCLE FOCUS;

CONSTELLATION

Automated inspection device comprising optical scanning hardware and software for the inspection and analysis of data, namely, the inspection and characterization of semiconductor wafers for defects;

CU EXPLORER

Scanning electron microscope system, namely, scanning electronic microscope, computer hardware and software all for reviewing and analyzing defects in semiconductor wafers in the field of semiconductor manufacturing and processing;

DEVICE TOOLBOX

Computer software used to provide central recipe storage and to create, edit, and save recipe files regarding semiconductor wafer data and to manage multiple machine configurations;DEVICE TOOL BOX;

DISCOVERY AT THE SPEED OF LIGHT

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools;Consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries; consulting services in the field of product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries with respect to yield management; providing technical information in the field of inspection, metrology and testing of the physical and electrical properties of semiconductors, integrated circuits and microelectronics for quality control;

ENABLING THE DIGITAL AGE

Providing training services in the field of inspection and metrology tools for semiconductors, integrated circuits and microelectronics;Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools;Consulting services in the field of yield management and product inspection and testing for the semiconductor, integrated circuit and microelectronics manufacturing industries; providing information in the field of inspection, metrology and testing of the physical and electrical properties of semiconductors, integrated circuits and microelectronics;

EPISCAN

measuring system comprising computer hardware and software for measuring film thickness, namely, EPI thickness, transition layer thickness and substrate carrier concentration of semiconductor wafers;

FLOORLINK

computer software for yield management in semiconductor manufacturing and testing;FLOOR LINK;

INDABA

Computer hardware and software used to implement diagnostic capabilities in semiconductor manufacturing equipment via computer networks;INDABA is a Zulu word meaning, meeting of the minds.;Consulting services in the field of semiconductor manufacturing and testing;

INFOTOOLS

Computer hardware and computer software for coordinating semiconductor processing functions;INFO TOOLS;

METRIX 100

Computer hardware, software and user manuals sold as a unit, and equipment, namely inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing;

MICROAE

OPTICAL INSPECTION DEVICE COMPRISED OF AT LEAST TWO ELLIPSOMETERS AND A MICROPROCESSOR, FOR USE IN MONITORING CHARACTERISTICS OF SEMICONDUCTORS DURING FABRICATION;

MICROSCAN

COMPUTER BASED STATION FOR THE AUTOMATIC CHARACTERIZATION OF SEMICONDUCTOR WAFERS AS TO THICKNESS, GLOBAL AND SITE FLATNESS, BOW, WARP, CONDUCTIVITY TYPE, RESISTIVITY AND OTHER PARAMETERS;MICRO SCAN;

NANOPRO

INSTRUMENTS FOR TESTING AND INSPECTING PHYSICAL AND ELECTRICAL PROPERTIES OF SEMICONDUCTORS; COMPUTER HARDWARE AND SOFTWARE USED FOR TESTING AND INSPECTING PHYSICAL AND ELECTRICAL PROPERTIES OF SEMICONDUCTORS;

NANOTOPOGRAPHY

apparatus and software for inspecting semiconductors, semiconductor wafers and parts therefor;

NANOTRACK

Computer hardware and accompanying software used to produce, encode, write, test, measure, inspect, certify and/or verify computer server disks, magnetic media and/or optical media.;

NANOXAM

evaluation machines and associated operating software for semiconductor-based products;

REALTIME CD

OPTICAL MEASUREMENT SYSTEM COMPRISING A LIGHT SOURCE, A DETECTOR AND A PROCESSOR FOR EVALUATING MICROSCOPIC GEOMETRIC FEATURES ON SEMICONDUCTOR WAFER;REAL TIME CD;CD;

REVIEWSMART

computer hardware and software and equipment consisting of inspection, metrology and testing hardware, all for inspection and testing of semiconductors during manufacturing and processing;REVIEW SMART; REVIEWS MART;

RICO

Computer software, hardware, and user manuals, sold as a unit, that facilitate communication and data sharing among inspection, metrology and testing hardware to be used for inspection, metrology and testing of materials and surfaces;The foreign wording in the mark translates into English as RICH.;

RPI

Computer hardware, software and user manuals sold as a unit, and equipment, namely, inspection, metrology and testing hardware, all for inspecting and measuring semiconductors during manufacturing and processing;

RTCD

Optical measurement system comprising a light source, a detector and a processor for evaluating microscopic geometric features on semiconductor wafers;

SOLUTIONPOINT

SOLUTION POINT;temporary use of non-downloadable software for troubleshooting equipment and computer hardware and software;

VALUE@VELOCITY

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools;VALUE AND VELOCITY;

WAFERXAM

evaluation machines, namely, inspection and measurement machines for defect and particle detection for semiconductor-based products, and associated operating software;

WATERFALL SAMPLING

computer software for yield management in semiconductor manufacturing and testing;SAMPLING;

XCRACK

Computer hardware; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools;X CRACK;

XPORT

Computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for providing analytic data on the performance of inspection and metrology tools;EXPORT;

YIELDASSIST

YIELD ASSIST;consulting services in the field of manufacturing of semiconductors;

YIELDLABOR

YIELD LABOR;consulting services in the field of manufacturing of semiconductors;

YIELDLINK

computer software for yield management in semiconductor manufacturing and testing;YEILD LINK;

YIELDONE

consulting services in the field of manufacturing of semiconductors;

YIELDSUPPORT

YIELD SUPPORT;consulting services in the field of manufacturing of semiconductors;

µAE

OPTICAL INSPECTION DEVICE COMPRISED OF AT LEAST TWO ELLIPSOMETERS AND A MICROPROCESSOR, FOR USE IN MONITORING CHARACTERISTICS OF SEMICONDUCTORS DURING FABRICATION;