APPARATUS SOFTWARE METROLOGY

Brand Owner (click to sort) Address Description
HARMONIX Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);HARMONICS;
MIRO Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);
MIROVIEW Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method, apparatus, and a system for providing data representation associated with non-sampled workpieces. Measured metrology data relating to a first workpiece is received. Metrology data corresponding to a second workpiece is approximated based upon the metrology data relating to the first workpiece to provide a projected metrology data relating to the second workpiece.