Bruker Nano, Inc.

ACUITYXR

Hardware and software for enhancing high performance of nanoscale metrology tools;

ACUITYXR

metrology tools for surface analysis and software for enhancing high performance of nanoscale metrology tools;ACUITY XR;

AUTOMET

Software for metrology tools, namely, analysis software for atomic force microscopes;AUTO METROLOGY;

BIOSCOPE RESOLVE

Metrology instrumentation, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);

CONTOUR ELITE

Metrology devices, namely, surface profiling machines and optical microscopes for characterizing and measuring surface parameters of samples;

CONTOURGT

Metrology devices, namely, surface profiling machines for measuring surface primary form, surface roughness and other surface parameters of samples;CONTOUR GT;

DEKTAKXT

Surface measurement equipment comprised of stylus based surface profilers, and probes and computer software therefor;

DIMENSION

PROBE BASED TOOL USED TO CREATE IMAGES OF SUBMICRON SCALE FEATURES, NAMELY TOPOGRAPHICAL, PHYSICAL, CHEMICAL, ELECTRICAL, AND MAGNETIC PROPERTIES OF MATERIALS;

DIMENSION FASTSCAN

Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; Software for operating probe-based instruments;DIMENSION FAST SCAN;FASTSCAN;

DIMENSION FASTSCAN BIO

probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating the aforementioned probe-based instruments;DIMENSION FAST SCAN BIO;FAST SCAN BIO;

DIMENSION ICONIR

probe-based instrument, namely, scanning probe microscopes, in particular, an atomic force microscope, used to acquire data corresponding to submicron scale sample features;

DTSENSE

Software employed to operate scanning probe microscopes, including atomic force microscopes;DT SENSE;

ENVIROSCOPE

SCANNING PROBE MICROSCOPES;ENVIRON SCOPE;

FASTFORCE VOLUME

Metrology instruments, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);FAST FORCE VOLUME;VOLUME;

FASTSCAN

Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating probe-based instruments;FAST SCAN;

FASTSCAN

probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating probe-based instruments;FAST SCAN;

HARMONIX

Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);HARMONICS;

HYPERMAP

Probe-based instruments, namely, atomic force microscopes, and software for operating probe-based instruments;HYPER MAP;

HYSITRON

Nanomechanical testing instruments with and without in situ test capability comprising of probe, transducer, controller and operating computer software and/or operating computer firmware;

ICON

Metrology instruments and components thereof, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);

ICONIR

probe-based instrument, namely, scanning probe microscopes, in particular, an atomic force microscope, used to acquire data corresponding to submicron scale sample features;

INNOVA

Metrology instruments and components thereof, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);

INSIGHT

Metrology instruments and components thereof, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);

INSPIRE

Atomic Force Microscopes and Scanning Probe Microscopes;

LUMIMAP

metrology system comprising metrology tools for surface analysis and software for enhancing high performance of nanoscale metrology for in-situ monitoring of expatial layers grown on a substrate;LUMIMAP; LUMINANCE MAP;

MASKCLEAN

MASK CLEAN;CO2 snow cleaning systems, primarily composed of carbon dioxide (CO2) filled cylinders and attached nozzles, tubing, and related system tools for use in cleaning of semiconductor wafers, electronic and optical components, and combinations of same;

MIRO

Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);

MIROVIEW

Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atomic force microscopes (AFMs), and software for facilitating the operation of metrology instruments in the nature of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);

MULTIMODE

atomic force microscopes and associated computer software for use in characterizing or analyzing the properties of samples or other objects;MULTI-MODE;

NANO PROBES

tips in the nature of micromachined protrusions on the end of flexible cantilevers for measuring the profile of a surface;PROBES;

NANO SCOPE

SCANNING TUNNELING MICROSCOPE;SCOPE;

NANOECR

Micromechanical instruments with electrical and mechanical characterization capabilities for data acquisition and testing in the nature of indentation, lateral force, scratch, and fatigue testing, scanning probe imaging and/or wear testing of surfaces, coatings, membranes, thin films, MENS/NEMS devices, biological materials and/or material interfaces, with the testing instruments being comprised of a probe, transducer, electrostatic controller, electrical source and meter, and computer firmware;

NANOIR

probe-based instruments, namely, atomic force microscopes and recorded operating software sold as a unit;

NANOSCOPE

scanning probe microscopes; software for operating scanning probe microscopes;NANO SCOPE;

NANOSNOW

Carbon dioxide based cryogenic aerosol cleaning equipment including nozzles, filters, gas delivery and blending components and related hardware for precision spray cleaning a surface to remove unwanted matter and contaminants;NANO SNOW;

NEURALIGHT 3D

Microscopes, and accessories therefor, namely, a holographic image generation attachment;NEURALIGHT THREE D;3D;

NEURALIGHT 3D ULTRA

microscopes, and accessories therefor, namely, a holographic image generation attachment;NEURA LIGHT THREE D ULTRA;3D ULTRA;

PEAK FORCE TAPPING

SOFTWARE FOR OPERATING PROBE-BASED INSTRUMENTS IN THE FIELDS OF MANUFACTURING AND SCIENTIFIC RESEARCH; HARDWARE FOR FACILITATING A MODE OF OPERATION SOLD AS AN INTEGRAL PART OF PROBE-BASED INSTRUMENTS, NAMELY, SCANNING PROBE MICROSCOPES AND ATOMIC FORCE MICROSCOPES;TAPPING;

PEAKFORCE QNM

SOFTWARE FOR OPERATING PROBE-BASED INSTRUMENTS IN THE FIELDS OF MANUFACTURING AND SCIENTIFIC RESEARCH; HARDWARE FOR FACILITATING MECHANICAL PROPERTY MEASUREMENT OF SAMPLES SOLD AS AN INTEGRAL PART OF PROBE-BASED INSTRUMENTS, NAMELY, SCANNING PROBE MICROSCOPES AND ATOMIC FORCE MICROSCOPES;PEAK FORCE QUANTUM;

PEAKFORCE TAPPING

software for operating probe-based instruments in the fields of manufacturing and scientific research; hardware for facilitating a mode of operation sold as an integral part of probe-based instruments, namely, scanning probe microscopes and atomic force microscopes;PEAK FORCE TAPPING;TAPPING;

PEAKFORCE-QI

recorded and downloadable software for operating probe-based instruments, and sometimes sold together therewith, in the fields of manufacturing and for use in scientific research; hardware for facilitating a mode of operation sold as integral part of probe-based instruments, namely, scanning probe microscopes and atomic force microscopes;PEAK FORCE QI;

PERFORMECH

Electronic controllers and software for operating nanomechanical testing instruments and accessories;PERFORM MECHANICAL;

PICOINDENTER

Micromechanical Testing Instruments Comprised of Probe, Transducer, Electrostatic Controller, and Computer Firmware for Data Acquisition for Indentation, Lateral Force, Scratch, Fatigue, and/or Wear Testing of Surfaces, Coatings, Membranes, Thin Films, Biological Materials and/or Material Interfaces;

PRECISIONCLEAN

PRECISION CLEAN;High purity gas, namely carbon dioxide for industrial cleaning processes;

PRECISIONCLEAN

POWER OPERATED CRYOGENIC CLEANING TOOLS AND COMPONENTS THEREOF, NAMELY, CRYOGENIC AEROSOL PROCESSING AND CLEANING TOOLS INCLUDING ENCLOSED PROCESSING/CLEANING ASSEMBLIES, CRYOGENIC SPRAYERS AND SPRAY NOZZLES, HOLDERS, FIXTURES, AND CONVEYORS FOR HOLDING AND CONVEYING THE OBJECTS TO BE PROCESSED AND CLEANED THROUGH THE PROCESSING/CLEANING ASSEMBLIES, CHARGE NEUTRALIZERS, AIR BLOWERS, AIR FILTERS, CRYOGEN PURIFICATION FILTERS, AND HEATERS FOR HEATING THE OBJECTS TO BE PROCESSED/CLEANED;PRECISION CLEAN;

RESOLVE

Metrology instrumentation, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs);

SCANASYST

SOFTWARE FOR OPERATING PROBE-BASED INSTRUMENTS; PROBE-BASED INSTRUMENTS IN THE FIELDS OF MANUFACTURING AND SCIENTIFIC RESEARCH; HARDWARE FOR FACILITATING USER EASE-OF-USE SOLD TO BE AN INTEGRAL PART OF PROBE-BASED INSTRUMENTS, NAMELY, SCANNING PROBE MICROSCOPES AND ATOMIC FORCE MICROSCOPES;

SEEING IS BELIEVING

Mechanical testers in the nature of micro- and nanomechanical testing instruments for conducting compression, tensile, indentation, lateral force, scratch, fatigue, and/or wear testing and data acquisition inside electron microscopes;

SNOWSTRIP

pressurized gas vessels or containers in the nature of carbon dioxide snow blended with at least one solvent and/or at least one surfactant for cleaning applications and related processes;SNOW STRIP;

SUPERSENSE

Software employed to operate scanning probe microscopes, including atomic force microscopes;SUPER SENSE;

SVXR

The mark consists of the stylized wording SVXR where the letters SV and R are in deep blue and the letter X is in light blue with cutouts.;Downloadable industrial process control software; Electro-optical instruments for use in inspection and measurement of industrial components; Industrial X-ray apparatus in the nature of testing equipment for determining industrial flaws; Instruments for detecting and measuring two-dimensional distribution of force and pressure; Water testing instrumentation for monitoring and detecting contamination; X-ray apparatus not for medical purposes;The color(s) deep blue and light blue is/are claimed as a feature of the mark.;