ATOMIC FORCE MICROSCOPES SCANNING

Brand Owner Address Description
INSPIRE Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Atomic Force Microscopes and Scanning Probe Microscopes;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An electrical scanning probe microscope (SPM) apparatus. The SPM apparatus is equipped with an atomic force microscope with an infrared laser source, a position-sensitive photo-detector (PSPD) to provide a topographic image, a charge-coupled device (CCD) monitor for optical alignment, and an electrical scanning sensor operatively coupled to the atomic force microscope to acquire synchronous two-dimensional electrical images. The photoperturbation effects induced by stray light and perturbation of the contrast of SCM images can thus be ameliorated.