ELECTRONIC INSPECTION APPARATUS FOR SEMICONDUCTORS

Brand Owner Address Description
METRA Nanometrics Incorporated 1550 Buckeye Drive Milpitas CA 95035 ELECTRONIC INSPECTION APPARATUS FOR SEMICONDUCTORS;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An inspection system, and process for use thereof, for inspecting semiconductors or like substrates. The inspection system includes an inspection device and an auxiliary sensor apart from the inspection device. The auxiliary sensor is used to collect height data and generate a map of a semiconductor or like substrate to aids in focusing the inspection device.