IMAGE ANALYSIS SOFTWARE CD SEMS

Brand Owner (click to sort) Address Description
2DPWA KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES 1-24-14 Nishi Shimbashi Minato-ku Tokyo Japan Image analysis software for CD-SEMs (Scanning Electron Microscope); computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage and management software;TWO DP WA; TWO DPWA;
HI-FRAME KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES 1-24-14 Nishi Shimbashi Minato-ku Tokyo Japan Image analysis software for CD-SEMs (Scanning Electron Microscope); computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage and management software;HIGH-FRAME;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An image processing method and apparatus for encoding and decoding image data in which the coding and decoding method may be simplified based on factors such as processing speed requirements. In encoding, an image input unit receives a first image and a second image (key frames). A matching processor begins performing a multiresolutional analysis using pixel-by-pixel matching between the images but, due to predetermined factors or settings, either discontinues the analysis or switches to a simplified method of analysis prior to the final resolution level. If the analysis is discontinued during encoding (i.e. at the encoding side), the analysis may be completed at the decoding side prior to conducting the decoding and the decoding side may be arranged accordingly.