KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES

2DPWA

Image analysis software for CD-SEMs (Scanning Electron Microscope); computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage and management software;TWO DP WA; TWO DPWA;

CDRECS

Remote control apparatus for scanning electron microscopes and semiconductor inspection and evaluation systems, namely, a command center remote console comprised of a computer processor, hard drive, CD-RW/DVD-ROM reader, video controller, LCD displays, keyboard and mouse, operating software, notification and management software, power supply connectors, and uninterruptible power supply, a digital exchange box for connecting scanning electron microscopes to the command center remote console, a universal interface box for connecting scanning electron microscopes to the digital exchange box, a fiber optical module to connect the digital exchange box to the command center remote console, a power controller, and a hardware rack;

DESIGNGAUGE

[Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography;] software for evaluation and inspection of semiconductors and semiconductor wafers;DESIGN GAUGE;

DESIGNGAUGE-ANALYZER

Metrology software for use in the manufacturing of semiconductors; software for the evaluation and inspection of semiconductors and semiconductor materials; software for use in processing semiconductor wafers, software for analyzing, measuring, and contouring based on electron microscope images and data;DESIGN GAUGE-ANALYZER;

HI-FRAME

Image analysis software for CD-SEMs (Scanning Electron Microscope); computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage and management software;HIGH-FRAME;

HIANALYZER

Computer programs for use in the operation of Scanning Electron Microscopes (SEM) in the field of SEM metrology; computer programs for the manipulation, analysis, storage and management of SEM data and images; computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage software; database management software; networking software for administration of computer networks;HI ANALYZER;

HIBROWSE

Computer programs for use in the operation of Scanning Electron Microscopes (SEM) in the field of SEM metrology; computer programs for the manipulation, analysis, storage and management of SEM data and images; computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage software; database management software; networking software for administration of computer networks;HI BROWSE; HIGH BROWSE;

HICONTOUR

Computer programs for use in the operation of Scanning Electron Microscopes (SEM) in the field of SEM metrology; computer programs for the manipulation, analysis, storage and management of SEM data and images; computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage software; database management software; networking software for administration of computer networks;HI CONTOUR; HIGH CONTOUR;

HIDELTA

Computer programs for use in the operation of Scanning Electron Microscopes (SEM) in the field of SEM metrology; computer programs for the manipulation, analysis, storage and management of SEM data and images; computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage software; database management software; networking software for administration of computer networks;HI DELTA; HIGH DELTA;

HITRACER

Computer programs for use in the operation of Scanning Electron Microscopes (SEM) in the field of SEM metrology; computer programs for the manipulation, analysis, storage and management of SEM data and images; computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage software; database management software; networking software for administration of computer networks;HI TRACER; HIGH TRACER;

HIZONE

Computer programs for use in the operation of Scanning Electron Microscopes (SEM) in the field of SEM metrology; computer programs for the manipulation, analysis, storage and management of SEM data and images; computer software platform for the management and integration of SEM (Scanning Electron Microscope) metrology applications software; data and image storage software; database management software; networking software for administration of computer networks;HI ZONE; HIGH ZONE;

IMPACT

Comprehensive preventative maintenance services for critical dimension-scanning electron microscopes, maintenance services for critical dimension-scanning electron microscopes;

INSPAGO

Electron microscopes; scanning electron microscopes; semiconductor and integrated circuit evaluation and inspection apparatus in the nature of an electronic imaging platform for use in semiconductor manufacturing and integrated circuit manufacturing;

MINISCOPE

Electron microscopes, downloadable image processing software for scanning electron microscopes and operating system software for scanning electron microscopes;MINI SCOPE;

NANOBLUE

Electron microscopes;NANO BLUE;

NANODUE'T

Scanning electron microscopes; scanning transmission electron microscopes; Focused ion beam system for the design, inspection and manufacture of semiconductors; compatible specimen holders for scanning electron microscopes, scanning transmission electron microscopes, scanning transmission electron microscopes, and focused ion beam systems; electronic devices to integrate focused ion beam systems with a scanning transmission electron microscope or a transmission electron microscope for the design, inspection and manufacture of semiconductors;

NANOEBAC

An electrical current amplifier for semiconductor test and diagnostic apparatus; electrical current amplifier for scanning electron microscopes used in semiconductor testing and diagnosis;

NANOFRONTIER

Mass spectrometers; computer hardware for use with mass spectrometers; computer software used to collect, process, manage, and communicate information in the field of mass spectrometry; computer software used to control and operate mass spectrometers;

QUECD

Mass spectrometers; computer hardware for use with mass spectrometers; computer software used to collect, process, manage, and communicate information in the field of mass spectrometry; computer software used to control and operate mass spectrometers;

RECIPEDIRECTOR

Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography; software for evaluation and inspection of semiconductors and semiconductor wafers;RECIPE DIRECTOR;

RECIPEDIRECTOR

RECIPE DIRECTOR;RECIPE DIRECTOR;Computer programming services; designing, developing, customizing, installing, integrating, networking, hosting, operating, repairing and maintaining software; ASP (Application Service Provider) services, namely, hosting software of others; consulting services in the field of Scanning Electron Microscopes (SEM) metrology software and data storage; non-downloadable image analysis software for CD-SEMs (Scanning Electron Microscopes); software as a service (SAAS) services, featuring image analysis software for CD-SEMs;

SHOGEN

Educational services, namely, online training in the field of career coach consulting; consulting services in the field of online education related to career coaching and working styles;Electronic sensors for the collection of sound, temperature, and location information; computer software to monitor and program electronic sensors for the collection of sound, temperature, and location information; computer hardware;Business consultation services;Design and customization of computer hardware, integrated circuits, communications hardware and software and computer networks for others; installation of computer software; maintenance of computer software; rental of computer hardware and computer software; application service provider (ASP) services, namely, hosting computer software applications of others;

ZONESEM

Scientific instruments and apparatus, namely, ultraviolet (UV) cleaning and sanitizing equipment for removal of contaminants and particulates from scanning and transmission electron microscope samples and laboratory specimen samples and microscopes;

ZONETEM

Scientific instruments and apparatus, namely, ultraviolet (UV) cleaning and sanitizing equipment for removal of contaminants and particulates from scanning and transmission electron microscope samples and laboratory specimen samples and microscopes;