METROLOGY SYSTEM

Brand Owner (click to sort) Address Description
AEROSPECT AMETEK PRECITECH, INC. 44 Blackbrook Road Keene NH 03431 METROLOGY SYSTEM, COMPRISED OF ROTARY TABLE, STAND, MEASUREMENT GAUGES, COMPUTER HARDWARE AND SOFTWARE, FOR MEASURING, STACKING, ASSEMBLY, INSPECTION, ALIGNMENT, AND QUALIFICATION OF COMPONENTS AND ASSEMBLIES USED IN JET ENGINE AND GAS TURBINE MANUFACTURE;
CALIPER MOSAIC Nanometrics Incorporated 1550 Buckeye Drive Milpitas CA 95035 Metrology system, namely, an automated wafer handling system comprised of axis drives for positioning the wafer, an optical imaging microscope, and an image processing and control computer, for the measurement of registration and overlay errors on semiconductor wafers and similar substrates in the manufacturing process;CALIPER;
VERA APPLIED MATERIALS, INC. 3050 Bowers Avenue Santa Clara CA 95054 Metrology system, namely, deep ultraviolet laser scanner for detecting defects and particles created during the manufacture of semiconductor devices on wafers;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method, apparatus, and a system for providing data representation associated with non-sampled workpieces. Measured metrology data relating to a first workpiece is received. Metrology data corresponding to a second workpiece is approximated based upon the metrology data relating to the first workpiece to provide a projected metrology data relating to the second workpiece.