MICROMECHANICAL INSTRUMENTS WITH ELECTRICAL

Brand Owner Address Description
NANOECR Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Micromechanical instruments with electrical and mechanical characterization capabilities for data acquisition and testing in the nature of indentation, lateral force, scratch, and fatigue testing, scanning probe imaging and/or wear testing of surfaces, coatings, membranes, thin films, MENS/NEMS devices, biological materials and/or material interfaces, with the testing instruments being comprised of a probe, transducer, electrostatic controller, electrical source and meter, and computer firmware;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method for fabricating an optical device and micromechanical device, wherein both devices are monolithically-integrated with a substrate. The optical surfaces and micromechanical devices are each formed in an etch step that is well-suited for forming that device. In addition, the embodiments of the present invention enable the optical surface and micromechanical device to be fabricated irrespective of severe topography on the surface of the substrate.