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Brands and Their Owners
| Brand | Owner (click to sort) | Address | Description |
|---|---|---|---|
| AIRES | EUV TECH, INC. | 2830 Howe Road, Suite A Martinez CA 94553 | Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; |
| ARIES | EUV TECH, INC. | 2830 Howe Road, Suite A Martinez CA 94553 | Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; |
| EXNODES | Exnodes Inc. | 41688 Christy St Fremont CA 94538 | Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; An optical metrology inspection system comprised of a light source, one or more cameras and sensors in communication with computer software and hardware; Electro-optical instruments for use in inspection and measurement of industrial components; |
| IMPERIA | ONTO INNOVATION INC. | 16 Jonspin Road Wilmington MA 01887 | Optical inspection apparatus for inspection of semiconductor wafers; optical metrology inspection system comprised of a light source, one or more cameras and sensors in communication with computer software and hardware; |
| MVM-SEM | ADVANTEST CORPORATION | 32-1, Asahicho 1-chome, Nerima-ku Tokyo Japan | Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photomasks; |
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| NEGEVTECH | Negevtech, Ltd. | 12 Hamada Street Rehovot 76703 Israel | Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; |
| PMSTATION | ADVANTEST CORPORATION | 32-1, Asahicho 1-chome, Nerima-ku Tokyo Japan | Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photomasks; Computer software used for the operation and control of photomask inspection and testing machines; Semiconductor testing machines for testing and inspecting wafers and integrated circuits;PM STATION; |
| RXSPEC | Analytical Spectral Devices, Inc. | 5335 Sterling Drive, Suite A Boulder CO 80301 | Optical inspection apparatus for inspection of finished pharmaceuticals; |
| SEMIPROBE | SemiProbe, Inc | 276 East Allen Street, Suite 4 Winooski VT 05404 | Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks; Probes for testing integrated circuits;SEMI PROBE; |
| VERTEX | Nanometrics Incorporated | 1550 Buckeye Drive Milpitas CA 95035 | Optical inspection apparatus for inspection and measurement of semiconductor wafers and similar substrates in various stages of processing comprised of a control computer, software, automatic recipe controlled sample handling, monochromatic illumination sources, light sensors, cameras, optical filters, and monochrometers and spectrometers; |
| XPRO | Exnodes Inc. | 41688 Christy St Fremont CA 94538 | Optical inspection apparatus for inspection of semiconductor materials, namely, semiconductor wafers, reticles, and photomasks;X PRO; |
Where the owner name is not linked, that owner no longer owns the brand |
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