PROBE BASED INSTRUMENT

Brand	Owner (click to sort)	Address	Description
DIMENSION ICONIR	Bruker Nano, Inc.	112 Robin Hill Road Santa Barbara CA 93117	probe-based instrument, namely, scanning probe microscopes, in particular, an atomic force microscope, used to acquire data corresponding to submicron scale sample features;
ICONIR	Bruker Nano, Inc.	112 Robin Hill Road Santa Barbara CA 93117	probe-based instrument, namely, scanning probe microscopes, in particular, an atomic force microscope, used to acquire data corresponding to submicron scale sample features;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

Device having removable probe system and a stylus instrument. The probe system is connected to the stylus instrument in a zero position by the attractive force of the permanent magnet. A mechanical lever system is provided, which comprises a spring and, when the probe system is pulled out, transfers the probe system together with a part of the stylus instrument from the zero position into a replacing position through a displacement motion. At the same time, the permanent magnet is spatially separated from the probe system and the attractive force which acts between the probe system and the stylus instrument is reduced.