PROBE BASED INSTRUMENTS

Brand Owner (click to sort) Address Description
DIMENSION FASTSCAN Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; Software for operating probe-based instruments;DIMENSION FAST SCAN;FASTSCAN;
DIMENSION FASTSCAN BIO Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating the aforementioned probe-based instruments;DIMENSION FAST SCAN BIO;FAST SCAN BIO;
FASTSCAN Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating probe-based instruments;FAST SCAN;
FASTSCAN Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; software for operating probe-based instruments;FAST SCAN;
HYPERMAP Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 Probe-based instruments, namely, atomic force microscopes, and software for operating probe-based instruments;HYPER MAP;
NANOIR Bruker Nano, Inc. 112 Robin Hill Road Santa Barbara CA 93117 probe-based instruments, namely, atomic force microscopes and recorded operating software sold as a unit;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Methods, systems, and computer program products for measuring a capacitance between a probe and a liquid, pausing movement of the probe based on a rate of change of the capacitance, further measuring the capacitance while the probe is paused, and, based on the further measurements, performing one or more of: resuming movement of the probe, determining a position of the probe, aspirating liquid into the probe, and dispensing from the probe. Resuming movement of the probe can include returning iteratively to measuring a capacitance, and the further measuring can be performed for a time interval that can vary based on the further measured capacitance(s), a probe movement characteristic, and/or a sampling rate.