SCANNING ELECTRON MICROSCOPES

Brand Owner (click to sort) Address Description
AUTOSCAN ETEC CORPORATION Hayward CA SCANNING ELECTRON MICROSCOPES;
DESIGNGAUGE KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES 1-24-14 Nishi Shimbashi Minato-ku Tokyo Japan [Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography;] software for evaluation and inspection of semiconductors and semiconductor wafers;DESIGN GAUGE;
ECO Amray, Incorporated 160 Middlesex Turnpike Bedford MA 01730 scanning electron microscopes;
LEO OPENX CARL ZEISS NTS GMBH Carl-Zeiss-Strasse 56 73447 Oberkochen Germany scanning electron microscopes; transmission electron microscopes; X-ray spectrometers;
LEO OPENX LE ELEKTRONEMIKROSKOPIE GMBH CARL-ZEISS-STRASSE 56 73446 OBERKOCHEN Germany scanning electron microscopes; transmission electron microscopes; X-ray spectrometers;
MICROSCALE KABUSHIKI KAISHA HITACHI SEISAKUSHO 6-6, Marunouchi 1-chome, Chiyoda-ku Tokyo 100-8280 Japan precision measuring standard sample used with scanning electron microscopes;
NANODUE'T KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES 1-24-14 Nishi Shimbashi Minato-ku Tokyo Japan Scanning electron microscopes; scanning transmission electron microscopes; Focused ion beam system for the design, inspection and manufacture of semiconductors; compatible specimen holders for scanning electron microscopes, scanning transmission electron microscopes, scanning transmission electron microscopes, and focused ion beam systems; electronic devices to integrate focused ion beam systems with a scanning transmission electron microscope or a transmission electron microscope for the design, inspection and manufacture of semiconductors;
NETSEM LEO Electron Microscopy Limited Clifton Road Cambridge, CB1 3H United Kingdom scanning electron microscopes, transmission electron microscopes, focused ion beam instruments, X-ray spectrometers, and parts for all the aforesaid goods;installation and maintenance of scanning electron microscopes, transmission electron microscopes, focused ion beam instruments and X-ray spectrometers;technical consultancy and advisory services relating to scanning electron microscopes, transmission electron microscopes, focused ion beam instruments and X-ray spectrometers;
OMNISCAN ETEC CORPORATION Hayward CA SCANNING ELECTRON MICROSCOPES;
OPENX LEO Electron Microscopy Limited Clifton Road Cambridge, CB1 3H United Kingdom scanning electron microscopes; transmission electron microscopes; X-ray spectrometers;
OPTI-SEM TOPCON TECHNOLOGIES, INCORPORATED 37 West Century Road Paramus NJ 07652 scanning electron microscopes;
PERSONAL SEM ASPEX 175 SHEFFIELD DR DELMONT PA 15626 scanning electron microscopes;SEM;
PERSONAL SEM RJ LEE INSTRUMENTS LIMITED 515 PLEASANT VALLEY ROAD TRAFFORD, PA 15085 scanning electron microscopes;SEM;
PMSITE ADVANTEST CORPORATION 32-1, Asahicho 1-chome, Nerima-ku Tokyo Japan Scanning electron microscopes; electron beam lithography equipment; telecommunication switches; electronic testing machines and apparatus for integrated circuits and other semiconductor devices and operating software for the aforesaid machines and apparatus; apparatus for reproducing sound and images and replacement and structural parts therefore;PM SITE;[ Designing scanning electron microscopes and electron beam lithography equipment, including their parts, or systems composed of such scanning electron microscopes and electron beam lithography equipment and providing technical support for the foregoing, namely, providing troubleshooting of hardware and software problems; computer software design, computer programming for others and maintenance of computer software; technical advice relating to performance, operation of computers, automobiles and other machines that require high level of personal knowledge, skill or experience for the operators to meet the required accuracy in operating them; testing and research on machines, apparatus and instruments; rental of computers; rental of computer software ];
PMSITE KABUSHIKI KAISHA ADVANTEST; (ADVANTEST CORPORATION) 32-1, Asahi-cho 1 chome Nerima-ku; Tokyo 179-0071 Japan Scanning electron microscopes; electron beam lithography equipment; telecommunication switches; electronic testing machines and apparatus for integrated circuits and other semiconductor devices and operating software for the aforesaid machines and apparatus; apparatus for reproducing sound and images and replacement and structural parts therefore;PM SITE;[ Designing scanning electron microscopes and electron beam lithography equipment, including their parts, or systems composed of such scanning electron microscopes and electron beam lithography equipment and providing technical support for the foregoing, namely, providing troubleshooting of hardware and software problems; computer software design, computer programming for others and maintenance of computer software; technical advice relating to performance, operation of computers, automobiles and other machines that require high level of personal knowledge, skill or experience for the operators to meet the required accuracy in operating them; testing and research on machines, apparatus and instruments; rental of computers; rental of computer software ];
PS RJ LEE GROUP, INC. 350 Hochberg Road Monroeville PA 15146 scanning electron microscopes;
PSM RJ LEE GROUP, INC. 350 Hochberg Road Monroeville PA 15146 scanning electron microscopes;
RECIPEDIRECTOR KABUSHIKI KAISHA HITACHI HIGH-TECHNOLOGIES 1-24-14 Nishi Shimbashi Minato-ku Tokyo Japan Scanning electron microscopes; semiconductor wafer evaluation and inspection apparatus for use in semiconductor manufacturing and lithography; semiconductor and integrated circuit evaluation and inspection apparatus for use in semiconductor manufacturing, integrated circuit manufacturing, and lithography; software for evaluation and inspection of semiconductors and semiconductor wafers;RECIPE DIRECTOR;
SEMNET LEO Electron Microscopy Limited Clifton Road Cambridge, CB1 3H United Kingdom scanning electron microscopes, transmission electron microscopes, focused ion beam instruments, X-ray spectrometers, and parts for all the aforesaid goods;installation and maintenance of scanning electron microscopes, transmission electron microscopes, focused ion beam instruments and X-ray spectrometers;technical consultancy and advisory services relating to scanning electron microscopes, transmission electron microscopes, focused ion beam instruments and X-ray spectrometers;
SEMTRAC NIKKISO CO., LTD 4-20-3, Ebisu Shibuya-ku Tokyo 150-6022 Japan Scanning electron microscopes, and parts thereof;Color is not claimed as a feature of the mark.;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A scanning transmission electron microscope which enhances correction accuracy of a de-scanning coil for canceling a transmitted-electron-beam position change on an electron detector. Here, this transmitted-electron-beam position change appears in accompaniment with a primary-electron-beam position change on a specimen caused by a scanning coil. First, control over the scanning coil is digitized. Moreover, while being synchronized with a digital control signal resulting from this digitization, values in a de-scanning table registered in a FM(2) are outputted to the de-scanning coil. Here, the de-scanning table is created as follows: Diffraction images before and after activating the scanning coil and the de-scanning coil are photographed using a camera. Then, based on a result acquired by analyzing a resultant displacement quantity of the diffraction images by the image processing, the de-scanning table is created.