SCIENTIFIC INSTRUMENT METROLOGY APPLICATIONS

Brand Owner Address Description
NANOMETRA Nanometrics Incorporated 1550 Buckeye Drive Milpitas CA 95035 Scientific instrument for metrology applications, namely, a metrology unit which is used to measure the critical dimensions and overlay registration achieved in submicron optical lithography;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method, apparatus, and a system for providing data representation associated with non-sampled workpieces. Measured metrology data relating to a first workpiece is received. Metrology data corresponding to a second workpiece is approximated based upon the metrology data relating to the first workpiece to provide a projected metrology data relating to the second workpiece.