SCIENTIFIC MEASURING INSTRUMENT USED

Brand Owner Address Description
METRASPEC Nanometrics Incorporated 1550 Buckeye Drive Milpitas CA 95035 scientific measuring instrument used to measure critical dimensions, lithography overlay registration, film thickness, and analysis of film composition during microelectronics manufacturing such as the production of integrated circuits;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method, a portable device and a measuring instrument for standardization of a satellite measuring instrument to a corresponding master measuring instrument are disclosed. The portable device includes a device for containing a reference material, and an information unit for storing information about the reference material and measurements of the reference material on the master measuring instrument. When placed in a satellite measuring instrument, information from the master instrument stored in the information unit of the portable device is transmitted automatically and wirelessly to the satellite instrument and, together with measurements by the satellite instrument of the reference masterial in the portable device, a standardization model for the satellite instrument and the sample type is obtained.