SURFACE MEASUREMENT EQUIPMENT COMPRISED

Brand	Owner	Address	Description
DEKTAKXT	Bruker Nano, Inc.	112 Robin Hill Road Santa Barbara CA 93117	Surface measurement equipment comprised of stylus based surface profilers, and probes and computer software therefor;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

An apparatus including: (i) an interferometer positioned to derive measurement and reference wavefronts from a source of electromagnetic radiation, wherein the interferometer is configured to direct the measurement wavefront to reflect from a measurement surface and the reference wavefront to reflect from a reference surface, and further directs reflected measurement and reflected reference wavefronts to overlap with one another and to form an interference pattern; (ii) an auxiliary optic having a curved reflective surface positioned to redirect the measurement wavefront between the interferometer and the measurement surface; and (iii) a translation stage, wherein paths for the measurement and reference wavefronts define an optical measurement surface corresponding to a theoretical test surface that would reflect the measurement wavefront to produce a zero optical path length difference between the measurement and reference wavefronts, and wherein the translation stage is configured to scan the optical measurement surface over the measurement surface.