ADE Corporation

ADE FACTORY

INSTALLATION AND MAINTENANCE OF COMPUTER HARDWARE;FACTORY;MEASUREMENT EVALUATIONS OF PHYSICAL, OPTICAL, AND ELECTRICAL PROPERTIES OF OBJECTS SUCH AS SEMICONDUCTOR WAFERS, COMPUTER DISKS, TIRES, PRECISION MOTOR ASSEMBLIES, AND MACHINED PARTS; SERVICES RELATED TO ASSOCIATED SOFTWARE, NAMELY DESIGN, INSTALLATION AND MAINTENANCE THEREOF, FOR SYSTEM CONTROL, DATA ACQUISITION, PROCESSING, DISPLAY AND COMMUNICATION, CUSTOM DESIGN FOR OTHERS OF MATERIAL HANDLING SUBSYSTEMS, AND PROVIDING SUCH SUBSYSTEMS;

ADE TENSOR

signal processors, namely computer implemented signal processors for measuring or characterizing semiconductor wafers, computer disks, tires, precision motion assemblies and machine parts;

ASC2000

System comprising computer hardware and software for measuring substrate characteristics, namely, for measuring semiconductor wafer characteristics;

AUTOGAGER

robotic device for magnetic disk media sorting, particularly for the sorting of hard disk drive media for use in the computer industry based on non-contact media analysis;AUTOMATIC GAGER;

AUTOGAGER

computerized robotic apparatus for magnetic disk media sorting, particularly the sorting of hard disk drive media for use in the computer industry based on non-contact media analysis;AUTO GAGER;

DCS-II

system comprising computer interface hardware and computer software for non-contact inspection and data analysis, particularly for the inspection, analysis and review of semiconductor wafers for defects and for yield management analysis;

FABTYE

Management information services, namely, gathering, analyzing and disseminating information obtained and used in semiconductor wafer manufacture and testing;

GALAXY

Inspection of substrates, particularly a system for inspection of semiconductor wafers, and more particularly for measurement of wafer flatness and shape and for detecting and classifying surface defects;

GALAXY AFS-300

Substrate inspection system, comprising hardware and associated software for measurement of substrates, namely, semiconductor wafers, to determine wafer flatness, shape, thickness, Bow Wrap and SORI, resistivity, conductivity and notch detection;

GALAXY AWIS - 300

Substrate inspection system, comprising non contact optical scanning equipment and associated software for inspecting semiconductor wafers and for detecting and classifying surface defects on wafers, namely, particles and scratches, polishing defects, crystal orientation defects, roughness, edge chips and cracks;

INFOHUB

hardware and software for coordinating semiconductor processing functions;INFORMATION HUB;

LITHOTOOLS

Software for use in measuring and analyzing flatness of substrates, particularly semiconductor wafers, and more particularly for lithographic, CMP process development and optimization of positioning;LITHOGRAPHIC TOOLS;

METROTOOLS

Software for use in measuring thickness of substrates, particularly semiconductor wafers, and more particularly backgrind characterization, film thickness, measurement and shape differencing;METRO TOOLS;

MICROSORT

Non-Contact Apparatus for Electronically Sorting and Gauging the Thickness and Resistivity of Semi-Conductor Substrates;No claim is made to exclusive use of Sort apart from the mark as shown in the drawing, but applicant waives none of its common law rights therein.;

NANOFLAT

NON-CONTACT SUBSTRATE SURFACE DIMENSION MEASUREMENT HARDWARE AND ASSOCIATED DATA ANALYSIS SOFTWARE FOR PROCESSING SUBSTRATE DATA, PARTICULARLY SEMICONDUCTOR WAFER DATA, AND FOR CLASSIFYING WAFERS BASED ON THEIR DIMENSIONAL DATA;

NANOFLATNESS

NON-CONTACT SUBSTRATE SURFACE GAUGE AND COMPUTER SOFTWARE OPERATIVE THEREWITH FOR SUBSTRATE SURFACE PROFILING IN THE SEMICONDUCTOR INDUSTRY;

NANOMASTER

Calibration standards for use in calibrating measurement apparatus;

NANOSORT

COMPUTER SOFTWARE, NAMELY COMPUTER SOFTWARE FOR ANALYZING SEMICONDUCTOR WAFERS FOR FLATNESS;

NANOSTANDARD

semiconductor wafer gauge structures having know dimensional properties to be used in place of semiconductor wafers for the purpose of calibrating semiconductor wafer non-contact dimensional measurement devices;

NANOSTRUCTURE

non contact gauge and associated software for dimensionally characterizing a substrate, particularly a semiconductor wafer;

NANOTOPOLOGY

NON-CONTACT OPTICAL IMAGING HARDWARE AND ASSOCIATED SOFTWARE FOR CHARACTERIZING THE SURFACE OF A SUBSTRATE SUCH AS A SEMI-CONDUCTOR WAFER;

NANOTOPOLOMETER

Device and software for the characterization of a substrate, particularly a device for the analysis of substrate data of semiconductor wafers, and particularly optical imaging, data analysis and characterization of wafer surfaces;

NANOTOPOMETER

optical imaging hardware for providing measurement of substrates, particularly semiconductors wafer and software for data analysis of the measurements to characterize substrate surfaces;

OPENADC

System comprising computer hardware and software for use in the analysis of substrate data, particularly semiconductor wafer data and more particularly for providing an open architecture for selection among analysis tools;OPEN ADC;

OPENADC

system comprising computer hardware and software for use in the analysis of substrate data, particularly semiconductor wafer data and more particularly for providing an open architecture for selection among analysis tools;

SQM

computer software for use in measuring the nanotopology of a wafer surface area to determine surface quality;

STRESSTOOLS

Software for use in measuring and analyzing stress values for substrates, particularly semiconductor wafers;STRESS STOOLS;

TENSOR

signal processors, namely computer implemented signal processors for measuring or characterizing semiconductor wafers, computer disks, tires, precision motion assemblies and machine parts;

UNIMET

A system comprising transduction and interface hardware and computer software for metrology of wafer substrates, particularly semiconductor wafers, their thickness, resistivity and conductivity;UNI MET;

WAFER REPORT CARD

computer hardware and software for analyzing semiconductor wafer characteristics and providing output data thereon;WAFER;computer services, namely, analyzing for others, semiconductor wafer characteristics and providing output data thereon;

WAFERANALYZER

SOFTWARE FOR USE IN THE DETECTION OF PROBLEMS IN THE SEMICONDUCTOR DEVICE PROCESS, BY SPEEDING THE DATA COLLECTION PROCESS, AUTOMATING, REPORTING AND CHARTING FUNCTIONS AND PROVIDING VISUAL INTERFACE FOR COMPLEX DATA OBTAINED FROM SEMICONDUCTOR INSPECTION AND MEASUREMENT SYSTEMS;WAFER ANALYZER;

WAFERCHECK

Apparatus for Electronic Non-Contacting Gaging, Testing, and Sorting of Semiconductor Substrates;

WAFERSCAN

Apparatus for Electronic Non-Contacting Flatness Gaging of Semiconductor Substrates;

YIELD ENHANCEMENT SOLUTIONS

Software for semiconductor wafer test data analysis;YIELD ENHANCEMENT;