METROLOGY APPARATUS INSPECTION

Brand Owner Address Description
ZBEAM Nanometrics Incorporated 1550 Buckeye Drive Milpitas CA 95035 Metrology apparatus for inspection of semiconductor wafers, substrates and lithographic masks including analysis of substrate and surface topology and defects;Z BEAM;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method, apparatus, and a system for providing data representation associated with non-sampled workpieces. Measured metrology data relating to a first workpiece is received. Metrology data corresponding to a second workpiece is approximated based upon the metrology data relating to the first workpiece to provide a projected metrology data relating to the second workpiece.